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. 2013 Jan 20;7(2):202–211. doi: 10.3109/17435390.2011.648667

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Figure 2. — Analysis cadmium telluride quantum dots (CdTe-QDs) by atomic force microscopy (AFM) and transmission electron microscopy (TEM). (A) AFM image of full commercial concentration of CdTe-QD deposited on freshly cleaved mica. The samples were also diluted to 20 μg/ml and deposited onto cleaved mica for AFM and formvar-coated copper grids for TEM. (B) Summary of Z-dimension size measurements of diluted CdTe-QDs as measured by AFM. (C) TEM image of diluted CdTe-QDs. (D) The diameter of each individual CdTe-QDs was measured at its minimum and maximum dimensions. These measurements were used to estimate the average aspect ration as a measure of sphericity, where 1 is an ideal circle.