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. 2012 Nov 10;68(Pt 12):o3311–o3312. doi: 10.1107/S160053681204559X
Agilent Technologies Gemini diffractometer 3908 independent reflections
Radiation source: sealed x-ray tube 3563 reflections with I > 2.0σ(I)
Graphite monochromator Rint = 0.029
ω scans θmax = 71.4°, θmin = 4.2°
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011) h = −15→15
Tmin = 0.80, Tmax = 0.95 k = −12→12
38976 measured reflections l = −19→19