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. Author manuscript; available in PMC: 2014 Apr 10.
Published in final edited form as: Chem Rev. 2012 Nov 12;113(4):2584–2667. doi: 10.1021/cr3002142

Figure 43.

Figure 43

Atomic force microscope (AFM) image of the surface of the channels used in 20 nm nanoslit DNA electrophoresis experiments measured using a 2 nm radius tip. The rms roughness is between 0.8 to 1.1 nm but the maximum hole depth is 8 nm. Reprinted with permission from Ref.450 Copyright 2008 American Chemical Society.