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. 2013 Mar 15;3:1461. doi: 10.1038/srep01461

Figure 2. Surface characterization of the six silicon substrates.

Figure 2

(A1–C2) Each line presents the Atomic Force Microscopy surface profile, the power spectrum and the contact angle measurement for a silicon substrate. In the last column, the contact angle (CA) is shown together with the Ra, Df and CA values for each analyzed substrate.