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. Author manuscript; available in PMC: 2014 Mar 26.
Published in final edited form as: ACS Nano. 2013 Feb 20;7(3):2676–2685. doi: 10.1021/nn4000644

Figure 2.

Figure 2

Characterization of dodecyl surface terminated Si NCs (Si NC-B) obtained from the reaction of Na4Si4 with NH4Br. (A) FT-IR spectrum of Si NCs-B (B) Bright-field TEM image of ca. 6 ± 2 nm diameter NCs Inset: High-resolution TEM image showing lattice spacings of 0.32 nm characteristic of the {111} plane. (C) Excitation wavelength dependant PL spectra in toluene. High resolution X-ray photoelectron spectra (XPS) of the (D) N 1s and (E) Si 2p spectral regions. Experimental (red) and fit (brown) data are provided. Only Si 2p2/3 fitting peaks are shown. Si 2p1/2 components have been omitted for clarity.