Skip to main content
. 2013 Mar 25;7(4):3276–3286. doi: 10.1021/nn305987x

Figure 1.

Figure 1

The 2θ–ω scans in logarithmic intensity scale of (a) LSC/STO and (b) LSM/LAO show only 00l diffraction peaks of LSC. X-ray diffraction reciprocal space maps for (c) LSC/STO and (d) LSC/LAO thin films. The arrows in (c) and (d) show the 103 reflections of the LSC thin films and the substrates.