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. 2013 Mar 25;7(4):3276–3286. doi: 10.1021/nn305987x

Figure 4.

Figure 4

Tracer depth profile of tensile strained LSC82/STO after annealing in 18O2 for 5 min at 400 °C illustrating the fitting method. The solid line denotes the actual fit, and the dotted line shows the idealized profile for the film thickness d and fitting parameters D* and k*.