Skip to main content
. 2013 Jan 2;21(1):87–101. doi: 10.1364/OE.21.000087

Fig. 8.

Fig. 8

Numerical microscope images of two rectangular scatterers buried inside the upper half space, under focused-beam illumination. (a) Refractive index map of the xy cross section at z = 300 nm. (b) The bright-field image of the structure, dominated by the light reflected from the interface. (c) The image with the reflection from the interface removed. This resembles the procedure followed in dark-field microscopy.