The topographical feature of ILM was scanned using atomic force microscope. (A) Wildtype. (B) POMGnT1 knockout. (C) Histogram of “valleys” according to different bin sizes (o-Mean, Mean to 1 standard deviation (sd), 1 sd to 2 sd, bigger than 2 sd). (D) Odd ratio of POMGnT1 knockout versus the wildtype. Data presented are Mean ± standard error. (E) AFM thickness scanning. Abbreviations: KO, knockout; sd, standard deviation.