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. Author manuscript; available in PMC: 2013 May 10.
Published in final edited form as: Phys Rev E Stat Nonlin Soft Matter Phys. 2008 May 1;77(5 0 1):051901. doi: 10.1103/PhysRevE.77.051901

FIG. 11.

FIG. 11

(a ) The dependence of chemical potential of the film μ on film thickness l = rrp for varied spontaneous curvatures. Curve A, Jr = Js = 0; curve B, Jr=1/14 nm−1, Js =1/8 nm−1; curve C, Jr = 0, Js =1/8 nm−1. The equilibrium width of the film is largest for maximum |JrJs|. (b) The dependence of the boundary energy W (per monolayer)on l. All parameters for curves AD are the same as in (a). In all curves of panels (a) and (b), hp = 2.5 nm, hr = 2.5 nm, hs = 2.0 nm, rp = 20 nm.