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. Author manuscript; available in PMC: 2013 May 10.
Published in final edited form as: Phys Rev E Stat Nonlin Soft Matter Phys. 2008 May 1;77(5 0 1):051901. doi: 10.1103/PhysRevE.77.051901

FIG. 13.

FIG. 13

The dependence of chemical potential of a film, μ, on film thickness l = r − rp. Curve A calculated the chemical potential by using the energy of fluctuations, Vfl, at a boundary. Curve B (which is the same as curve D in Fig. 4) uses the mean-field theory. For both curves hs = 2.0 nm and rp = 20 nm.