Table 2.
Characteristics of the Ti substrates coated with different densities of Se nanoparticles
Substrate | Selenium surface fraction, ρ,* (%) | Relative surface roughness, r** | Relative RMS, R† | cos(θ)‡ |
---|---|---|---|---|
uTi | 0 | 1 | 1 | 0.433 |
Low-nSe-Ti | 2.4 | 1.0373 | 1.204 | 0.274 |
Medium-nSe-Ti | 5.0 | 1.050 | 1.556 | 0.262 |
High-nSe-Ti | 6.2 | 1.054 | 1.748 | 0.220 |
Notes:
Determined from SEM images;
determined from AFM, normalized by that of the uncoated substrates;
normalized to that of uncoated substrates;
calculated from measured contact angles.
Abbreviations: AFM, atomic force microscopy; high-nSe-Ti, Ti substrates coated with a high density of Se nanoparticles; low-nSe-Ti, Ti substrates coated with a low density of Se nanoparticles; medium-nSe-Ti, Ti substrates coated with a medium density of Se nanoparticles; RMS, root mean square roughness; Se, selenium; SEM, scanning electron microscope; Ti, titanium; uTi, uncoated Ti substrates.