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. 2013 Jul 6;10(84):20130070. doi: 10.1098/rsif.2013.0070

Table 2.

Surface composition of the different samples, as detected by XPS analysis.

sample Ti2p3 (%) O1s (%) C1s (%) N1s (%) Na1s (%) Si2p (%)
TC etched 31.33 63.00 4.65 1.02
TC-A etched 24.06 63.60 4.94 0.58 6.82
TC-AA etched 11.98 45.66 23.87 5.46 1.53 11.50
TC-A(C/H)6 etched 3.29 16.37 67.88 11.90 0.56
TC-AA(C/H)6 etched 1.31 13.76 72.12 12.00 0.11 0.70