. 2013 Jun 18;69(Pt 7):1260–1273. doi: 10.1107/S0907444913015308

Table 2. Average R _merge values for processing of 38 sweeps of diffraction data with XDS following five protocols, each normalized to the value corresponding to `generate_XDS.INP` .

Clearly, all protocols are reliable and offer only small differences in the accuracy of the measured intensities, although the recycling of the reflection-profile parameters gave a measurable improvement.

Integration protocol	R/R _recommended	Success
(1) `generate_XDS.INP`	1.00	38
(2) + lattice constraints	1.00	38
(3) + recycle GXPARM	1.00	38
(4) + recycle profile parameters	0.98	38
(5) + recycle all corrections including detector distortions	1.02	38

Table 2. Average R merge values for processing of 38 sweeps of diffraction data with XDS following five protocols, each normalized to the value corresponding to generate_XDS.INP .

Table 2. Average R _merge values for processing of 38 sweeps of diffraction data with XDS following five protocols, each normalized to the value corresponding to `generate_XDS.INP` .