Figure 1. (A) and (C) Low-magnification TEM image of MoS_x/MWNTs with hierarchical nanostructure and MoS_x/MWNTs after annealing at 800°C under Ar protection, (B) and (D) HRTEM images of a free standing monolayer MoS_x and the side wall of the composite after annealing.

Inset in Figure 1 (B) shows the FFT pattern taken from the marked area. (E) Raman spectra of the MoS_x/MWNTs. Figure 1 (F) compares the magnified Raman signature of ta prepared MoS_x/MWTNs and the one after annealing.