Skip to main content
. 2008 Sep 15;8(9):5637–5648. doi: 10.3390/s8095637

Figure 6.

Figure 6.

EDX measurements coupled to SEM on the cross section for the reference (green line) and the fully processed (Full+SSC, red line) samples. Both measurements were acquired close to the porous SiO2/Si interface. In the insert the SEM image of a porous SiO2 sample cross section. The marker is 300 nm.