Table 3.

Changes in ion profile under different stress conditions

element		Low T	Low N	Low P
major	N	−0.199*	−0.993*	0.1431
	P	0.858*	1.463*	−1.194*
	S	−0.297*	−0.846*	−0.482*
	K	0.265*	0.406*	0.197*
	Mg	−0.886*	−0.674*	−0.288
	Ca	−1.144*	−1.095*	−0.247*
minor	Mn	−0.632*	0.003	0.510*
	Fe	−0.166	−0.663*	−0.143
	Zn	−0.284	−0.719*	0.288*
	Cu	−0.289*	−0.813*	−0.100
	Mo	−1.702*	−3.486*	−0.509*
	Sr	−1.306*	−1.140*	−0.241*
trace	Li	nd	−1.804*	−0.214*
	V	0.667	0.620	0.253*
	Cr	3.044	0.463	0.403
	Co	nd	0.542	−0.203
	Ni	0.757	0.882*	0.751*
	As	−1.198*	−0.466	−0.366*
	Rb	0.375	0.363*	0.406*
	Cs	−0.290	0.626*	0.114
	Pb	−0.675	−1.488*	nd
	Cd	−0.606*	−2.050*	0.229

Data is shown as log₂ fold change of stressed vs control values. The asteriks mark significant changes (t-test, p < 0.05); nd indicates that the measurement was below detection limit (not determined); low T low temperature, low N low nitrogen, low P low phosphorus.