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. 2013 Jul 22;4:190. doi: 10.3389/fphys.2013.00190

Figure 10.

Figure 10

Future developments for Plurigon feature output and analysis. Outline recognition of cryptic feature generation. As Plurigon generates a reliable-oriented three-dimensional figure it is likely that surface features may indeed have an impact upon the appreciable visual nature of the plurigon through obscuring other data points. Such an effect therefore generates an entirely new level of data that other applications may not due to their free-form structure or lack of three-dimensional rendering. To attempt to quantify this effect, and also create additional extractable data features for detailed data classification, we propose the following methodology. (A) A single exemplary plurigon is chosen and for a given set of coordinates for the axes an outline of the edge of plurigon can be generated, indicated by the presence of the blue line in panel (B). This trace can then be extracted in (C). With the same exemplary plurigon as in (A), slight rotation around the vertical y axis (D) helps generate a novel plurigon outline (E—red line) that also can be extracted (F). Even with small rotations (in axis required) the plurigon outline can clearly change [G—superimposition of (C) and (F) traces], due to both loss of features from the visual field or also via obscuration of newly-oriented features with respect to the plane of the viewer. To extract quantifiable features from such effects line-length scanning can be used from any direction required in the extracted trace box. In this case scanning line-length is determined by the termination of the scan line (black) at the blue (H) or red (I) plurigon trace outline. Extraction and matching of these scan lines [J,K; compared with minor vertical shift to improve comparison in (L)] can be used to discriminate divergent features of the plurigon based on this perspective-regulated analysis. The number of numerical features such as this can be easily scaled up or down based on the plurigon rotation angles and the orientation and density of the trace outline scan lines.