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. 2013 Jul 24;3:2275. doi: 10.1038/srep02275

Figure 2. Structural characterization.

Figure 2

(a), XRD spectrum of an InP film grown at 750°C. (b), EBSD image of the backside of a peeled off TF-VLS InP film, indicating large grain sizes of ~10–100 μm. (c), Top-view SEM image of InP peeled off from Mo foil, partially etched in 1% HCl to highlight grain boundaries.