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. 2013 Jul 19;69(Pt 8):1540–1552. doi: 10.1107/S0907444913010640

Figure 5.

Figure 5

(ac) X-band pELDOR measurements of DnaJ double mutants (a) T18C/S86C, (b) S86C/E95C and (c) I50C/V90C: background-corrected time traces and their Tikhonov regularization fits (left; regularization parameter α = 10) and corresponding distance distributions superimposed on their respective rotamer distribution predicted from the crystal structure (right). (d) X-band pELDOR measurements of DnaJ single mutants S86C (black) and S58C (blue) using a long time window for measurements of large distances. Dipolar evolution functions with Tikhonov regularization fit (inset; α = 100) and corresponding distance distributions (right). Colour codes above the distributions signify reliability intervals; the reliability of the mean distance of the calculated distribution peaks is shown from dark blue (highest reliability) to red (lowest reliability).