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. Author manuscript; available in PMC: 2013 Aug 13.
Published in final edited form as: Ultramicroscopy. 2010 Oct 26;111(2):90–100. doi: 10.1016/j.ultramic.2010.10.010

Table 2. diffraction orders visible in best images.

Spot
(index)
Resolution
(Å)
Comments Teare (1959) X-ray
structure amplitude
1,1 4.12 very strong 174
2,0 3.71 very strong 315
2,1 2.97 weak 77
0,2 2.48 strong 189
1,2 2.35 medium 89
3,1 2.21 medium 152
2,2 2.06 medium 131
4,0 1.85 very weak 33
3,2 1.75 very weak 70
4,1 1.73 very weak 71
1,3 1.61 weak (see inset in Figure 7) 50
2,3 1.51 very weak, highest resolution (inset to Figure 7) 63
5,1 1.42 - (not observed) 61
3,3 1.37 - (not observed) 45

Footnote to Table 2: The CTF is not known for any of the reflections in these low dose images, in which Thon rings from the supporting carbon film are not observed. The amplitudes of the higher order reflections will also be reduced by the envelope function of the microscope, which was not characterized in these experiments, and by the MTF of the film and film scanner.