Appendix C.

HA and procedural details

Citation	HA model	Experimental feature	Other features	Fitting prescription	Monaural/binaural testing	Duration
Boothroyd et al. (1988)	Master HA	WDRC	High-frequency emphasis circuit 2 channels	NR	Tested monaurally	20-min testing sessions over 4–5 weeks
Christensen (1999)	ITE Phonak Dyna P2 Programmable HA	WDRC/linear CL	Equalization 3 programs Multiple memory	DSL (WDRC) NAL-R (linear CL) NAL-R (linear PC)	Binaural	2 mo. in each condition
Gou et al. (2002)	Widex P38/C18+ (WDRC) Unspecified own aids (linear)	WDRC	Digital 3 channel Fully automatic gain control	Based on NAL-R and adjusted to account for device-specific features	Tested binaurally	1 test session with own, linear HA testing after 1, 3, and 5 mo. with test HA
Jenstad et al. (1999)	Siemens Viva Pro 2 BTE	WDRC	Programmable Single channel	DSL v 4.0	Tested monaurally	1 test session
Jenstad et al. (2000)	Siemens Viva 2 Pro BTE	WDRC	Programmable Single channel	DSL v. 4.0 [i/o]	Tested monaurally	1 test session
Marriage & Moore (2003)	Phonak Novoforte E3 or E4	WDRC	Programmable Single channel	Manufacturer software (WDRC) Adjusted to child’s previous HA settings (linear)	Binaural	1 test session
Marriage et al. (2005)	Phonak Supero 412	WDRC/linear CL	Digital 5 channel High power	DSL [i/o]	Binaural	1–2 weeks in each condition
Stelmachowicz et al. (1995)	Qualitone, KE (Compression) Unitron UM-60 (linear)	WDRC	NR	DSL	Monaural testing	1 test session

Note. ITE = in the ear; NAL-R = National Acoustic Laboratories–Revised; BTE = behind the ear; [i/o] = input/output.