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. Author manuscript; available in PMC: 2013 Aug 21.
Published in final edited form as: IEEE J Solid-State Circuits. 2008 Nov 21;43(11):2546–2557. doi: 10.1109/JSSC.2008.2005818

Fig. 13.

Fig. 13

Arrhenius plot of the lifetimes in the gated impulse response. The approximate activation energies of the traps are: ET1 = 0.143 eV, ET2 = 0.164 eV, and ET3 = 0.115 eV.