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. 2013 Aug 21;69(Pt 9):1033–1036. doi: 10.1107/S1744309113021921

Table 1. Data-collection and refinement statistics.

Values in parentheses are for the outer shell.

No. of crystals 1
Diffraction source Australian Synchrotron MX2
X-ray wavelength (Å) 0.95
Detector ADSC Quantum 315r
Crystal-to-detector distance (mm) 250
Rotation range per image (°) 1
Total rotation range (°) 360
Exposure time per image (s) 2
Data-collection temperature (K) 100
Space group P212121
Unit-cell parameters (Å, °) a = 58.08, b = 101.00, c = 163.80, α = β = γ = 90
Resolution range (Å) 3979.00–2.20 (2.27–2.20)
Unique reflections 49839
Total observations 355630
I/σ(I)〉 19.8 (2.1)
R merge 0.068 (1.21)
R meas = R r.i.m. 0.073 (1.415)
Wilson B factor (Å2) 41.74
Completeness (%) 99.9 (100)
Mosaicity (°) 0.18
Multiplicity 7.3

R merge = Inline graphic Inline graphic, where Ii(hkl) is the intensity of an individual measurement of the reflection with Miller indices hkl and 〈I(hkl)〉 is the mean intensity of that reflection. Calculated for I > −3σ(I).

R meas = R r.i.m. = Inline graphic Inline graphic, where I i(hkl) is the intensity of the ith observation of reflection hkl and 〈I(hkl)〉 is the weighted average intensity of all observations i of reflection hkl. N(hkl) is the multiplicity.