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. 2013 Sep 2;8:3415–3426. doi: 10.2147/IJN.S51203

Figure 1.

Figure 1

AFM image with height profiles (A) and XPS C1s spectra (B) of GO sheets.

Note: The black curve is obtained data, the brown one is the corresponding fitting curve.

Abbreviations: AFM, atomic force microscope; GO, graphene oxide; XPS, X-ray photoelectron spectroscope.