Fig. 1.

(Inset) Comparison of 1D and 2D a/LCI measurements superimposed on a typical scattering pattern, given as field amplitude. (Main) New 2D a/LCI system schematic. Light from Ti:Sapphire laser (λ = 830 nm Δλ = 17nm) is split into an input to the sample and a reference beam (red). Light scattered by the sample (green) is imaged onto the entrance slit of the spectrometer, located in a conjugate Fourier plane. By including an angle scanning mirror between L3 and L4, light in different scattering planes is made to overlap the entrance slit such that the scattering across the 2D plane can be measured.