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. 2013 Aug 29;2013:208081. doi: 10.1155/2013/208081

Figure 2.

Figure 2

Raman spectra measured for Si/SiO2/HfO2 sample, excitation wavelength 266 nm. Black solid line represents as-deposited sample, red points represents sample annealed at 400°C, green points represents sample annealed at 600°C, blue points represents sample annealed at 800°C.