Table 3. Estimates of mutational parameters.

Parameter	Data	Method	Estimate (95% CI)
ΔM	SGE	LMM	−0.0509% (–0.0649%, –0.0368%)
ΔV	SGE	LMM	0.00552% (0.00227%, 0.01279%)
Ve	SGE	LMM	0.0281 (0.0237, 0.0337)
Vm/Vea	SGE	LMM	0.0981% (0.0397%, 0.231%)
U	SGE	BM/LMM	0.00470 (0.00154, 0.01249)
s	SGE	BM/LMM	0.109 (0.0437, 0.272)
U	SGE1000	ML	0.00444 (0.00231, 0.00926)
s	SGE1000	ML	0.118 (0.0578, 0.194)
β	SGE1000	ML	∞ (0.00699, ∞)
ΔM	MGE	BM/LMM	−0.0403% (–0.0543%, –0.0264%)
ΔV	MGE	BM/LMM	0.000396% (0.000088%, 0.001027%)
Ve	MGE	BM/LMM	0.0158 (0.0126, 0.0200)
U	MGE	BM/LMM	0.0205 (0.00583, 0.101)
s	MGE	BM/LMM	0.0198 (0.00423, 0.0558)
h	MGE/BX	BM/LMM	0.257 (–0.0221, 0.622)
UL	Viability		<0.000374
U	Viability	ABC	0.00337 (0.00079, 0.00596)b
s	Viability	ABC	0.325 (0.136, 0.514)b

Parameters: ΔM, change in mean fitness per generation; ΔV, change in variance in fitness per generation; V_e, environmental variance; V_m/V_e, mutational heritability, where V_m = ΔV/2; U, deleterious mutation rate per haploid genome per generation; s, homozygous effect of a deleterious mutation; β, shape parameter of the gamma distribution of mutational effects; h, dominance coefficient; U_L, lethal mutation rate per haploid genome per generation. Data: SGE, MA experiment, single GE; SGE1000, single GE excluding data from t = 200 and 800 generations; MGE, multiple GE; BX, multiple backcrosses; Viability, viability in GE round II crosses. Approaches: LMM, linear mixed model; BM, Bateman-Mukai estimators (Table 1); ML, maximum likelihood; ABC, approximate Bayesian computation.

^aMutational heritability must be interpreted with caution in this system: although mutations may arise in the germline genome each generation, these mutations are not expressed, and therefore do not contribute to the mutational variance, except after conjugation occurs, which happens at most every ∼50 generations (Lynn and Doerder 2012).

^bMean and 95% confidence interval of the estimates shown in Figure 5B.