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. 2013 Jan 31;7(3):221–228. doi: 10.4161/pri.23807

Table 1. Diffraction data collection and refinement statistics for two crystals used for MBP-Htt36Q3H-EX1 structure determination.

Crystal X1 X2
Data collection
Wavelength (λ)
0.98
0.98
Space group
C2
C2
Unit Cell parameter (Å, o)
a
155.052
153.182
b
177.278
177.357
c
78.868
78.346
β
109.025
108.674
Resolution limit (Å)
2.8–40.0/2.8–2.9
2.8–40.0/2.8–2.9
Rsym(%)
11.0/53.2
6.6/65.3
I/σI (overall/outer shell)
27.9/2.1
17.2/1.0
Redundancy (overall/outer shell)
3.6/3.1
3.6/2.4
Overall completeness (%)
99.2
99.2
Refinement
X1-C1
X1-C2
X2-C1
X2-C2
B-factor
Overall (Å2)
54.3
55.8
56.2
56.1
Solvent
46.9
47.7
27.3
30.8
No of data
40324
39566
RWork/RFree
0.23/0.27
0.23/0.27
0.23/0.27
0.23/0.27
RMS_D (Å)
0.006
0.006
0.005
0.005
RMS_A (o)
0.912
0.912
0.789
0.789
Ramachandran map
Favored (%)
97.2
97.4
97.1
96.9
Allowed (%)
2.6
2.5
2.7
2.7
Outliner (%)
0.2
0.1
0.2
0.4
PDB accession number 4FE8 4FEB 4FEC 4FED