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. 2006 Mar 31;3(1):48–66. doi: 10.3390/ijerph2006030007

Figure 5:

Figure 5:

Complex aggregate composed of a mixture of carbon nanotube and related carbon nanoparticles and silica (SiO2) nanocrystal particles. (a) Bright-field TEM image with corresponding EDS spectrum showing C (Kα) and Si (Kα) peaks. The oxygen peak is suppressed in the X-ray emission competition. (b) Dark-field TEM image slightly shifted from (a) showing predominantly SiO2 strongly diffracting nanocrystals (reference X). The principal diffraction regimes marked 1 and 2 in the SAED pattern insert are characterized by overlapping (002)C/(101)SiO2 and (100)C/(200)SiO2 diffraction, respectively [26].