Figure 2. Experimental RESET behavior of a Pt/HfO2/Pt RRAM device.
(a) 10% G–V curves randomly selected from 1250 RESET cycles. (b)
and (c)
scatter plots for RESET1 (red circles) and RESET2 (blue circles) with data corrected by RS = 28 Ω. (d) Evolution of the conductance distribution with V in the 1250 successive RESET cycles. The intermediate states are those with conductance below 50G0.
