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. 2013 Oct 14;3:2929. doi: 10.1038/srep02929

Figure 2. Experimental RESET behavior of a Pt/HfO2/Pt RRAM device.

Figure 2

(a) 10% GV curves randomly selected from 1250 RESET cycles. (b) Inline graphic and (c) Inline graphic scatter plots for RESET1 (red circles) and RESET2 (blue circles) with data corrected by RS = 28 Ω. (d) Evolution of the conductance distribution with V in the 1250 successive RESET cycles. The intermediate states are those with conductance below 50G0.