. 2013 Sep 24;4(10):2231–2246. doi: 10.1364/BOE.4.002231

Table 1. Source characterization. λ = center wavelength, Δλ = spectrum width, f_rep = laser repetition rate, P_av,out = laser output power, P_source = laser power delivered to the sample at the source optode, A_source = illuminated area on the surface of the sample.

λ [nm]	Δλ [nm]	f_rep [MHz]	P_av,out [mW]	P_source [mW]	A_source[mm²]
687	3.4	80	0.936	0.577	7.5
826	5.2	80	0.266	0.163	7.5

Table 1. Source characterization. λ = center wavelength, Δλ = spectrum width, frep = laser repetition rate, Pav,out = laser output power, Psource = laser power delivered to the sample at the source optode, Asource = illuminated area on the surface of the sample.