Scanning electron micrographs of a multilayered
wedge structure made via template stripping. (a) Cross-section obtained
by focused-ion-beam milling. (b) Close-up of the cross section showing
the four layers of silver (Ag), aluminum-doped zinc oxide (AZO), silicon
(Si), and indium tin oxide (ITO) (from top to bottom). These layers
have thicknesses of ∼250, ∼65, ∼350, and ∼110
nm, respectively.