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. Author manuscript; available in PMC: 2013 Nov 12.
Published in final edited form as: Electrochim Acta. 2013 Feb 15;90:10.1016/j.electacta.2012.11.116. doi: 10.1016/j.electacta.2012.11.116

Figure 1.

Figure 1

Sketch of the beam path and the arrangement of the electrodes in the modified thin–layer analysis cell for SFG measurements. The reflected VIS and IR beams are not displayed.