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. 2013 Nov 14;3:3216. doi: 10.1038/srep03216

Figure 2. Results of the selective transfer and precise location.

Figure 2

(a-c), Optical images of (a) a monolayer MG patterned by femtosecond laser on a SiO2/Si wafer, (b) the patterned graphene located on a chosen microcavity obtained by selective transfer, and (c) the graphene/graphite flakes remaining on the original substrate. (d-f), The morphological images of the patterned graphene above the microcavity analyzed by (d) SEM, (e) AFM, and (f) Raman mapping with a 2D- to G-band intensity ratio.