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. Author manuscript; available in PMC: 2013 Nov 19.
Published in final edited form as: Langmuir. 2009 Dec 15;25(24):10.1021/la900799m. doi: 10.1021/la900799m

Table 1.

Atomic composition (%) measured by XPS of all elements, with the exception of Au, present on the alkanethiol SAMs (N=3, mean ± 95% CI). Advancing contact angle (10 mM phosphate buffer solution at pH 7.4) and thickness of SAM surfaces (N=6, mean ± 95% CI).

Alkanethiol SAM C1s S2p N1s O1s Contact
Angle (°)		 Thickness
(Å)
HS-(CH2)11-NH2 85.3 ± 1.4 3.2 ± 0.4 6.3 ± 0.5 5.2 ± 0.5 47.6 ± 1.8 14.7 ± 2.5
HS-(CH2)11-COOH 83.8 ± 3.2 2.8 ± 0.2 -- 13.4 ± 0.6 17.9 ± 1.3 15.8 ± 1.9
HS-(CH2)11-CH3 95.9 ± 1.0 4.1 ± 0.3 -- -- 100.9 ± 1.9 11.5 ± 2.2
HS-(CH2)11-OH 84.6 ± 1.2 4.2 ± 0.8 -- 11.2 ± 0.3 17.6 ± 1.9 12.1 ± 1.4