. Author manuscript; available in PMC: 2014 Apr 1.

Published in final edited form as: Ultramicroscopy. 2013 Jan 29;133:10.1016/j.ultramic.2013.01.003. doi: 10.1016/j.ultramic.2013.01.003

Table 2.

Estimated variance of the detector response to single-electron events, derived from the excess noise (at low frequency) in the power spectra of empty images, depending upon the type of detector and the electron energy.

	TVIPS F416 4kx4k 15.6 μm pixel	Gatan US4000 4kx4k 15.0 μm pixel	FEI Eagle 2kx2k 30 μm pixel	Gatan K2 4kx4k 5 μm pixel
80 keV	-	-	0.1	-
120 keV	1.1	1.2	-	-
200 keV	-	1.7	-	-
300 keV	-	-	1.0	1.1