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. 2013 Nov 27;3:3352. doi: 10.1038/srep03352

Figure 1. ITO probed by SPP-EFM.

Figure 1

(a) Height [nm]. (b) Goodness of fit R2. (c) Deconvolved channel proportional to the second derivative of the tip-sample capacitance (Q/2K)∂2C/∂z2V−2]. (d) Deconvolved channel corresponding to the tip-sample contact potential difference VCPD [V].