Skip to main content
. 2013 Dec 2;3:3374. doi: 10.1038/srep03374

Figure 1.

Figure 1

(a) Symmetric X-ray θ-2θ scan of the DMO/NSTO thin film. The inset shows a schematic drawing of the epitaxial growth of DMO on (001) NSTO. (b) Rocking curve around the (002) reflection for the film. The FWHM is ~0.72°. (c) and (d) present the data of reciprocal space mapping around the (103)C and (113)C reflections of the substrates, respectively. (e) 2 × 2 μm2 atomic force microscopy image of the film, in which islands dominate the surface morphology. The Rrms of film is estimated to be ~1.6 nm. The inset shows the topography with a smaller scanning size of 0.5 × 0.5 μm2, in which the island size can be derived to range from 40 nm to 80 nm.