Table II.

Average ± standard deviation and maximum relative differences between measurements obtained using the 3-point plastic scintillation detector and those obtained using the ion chamber for 100 MUs irradiations.

	Relative difference (%)
Scintillating element	Average ± SD	Max.
BCF-60
Profile (depth = 10 cm)	2.1 ± 1.4	4.2 ± 0.7
Profile (depth = 5 cm)	2.0 ± 1.5	3.8 ± 0.5
Depth-dose	1.3 ± 1.4	4.6 ± 2.2
45-degree wedge	3.9 ± 2.4	7.9 ± 3.7
BCF-12
Profile (depth = 10 cm)	1.6 ± 1.1	3.9 ± 0.4
Profile (depth = 5 cm)	1.7 ± 1.3	2.6 ± 2.8
Depth-dose	1.1 ± 0.5	2.0 ± 0.5
45-degree wedge	2.1 ± 1.1	4.1 ± 2.1
BCF-10
Profile (depth = 10 cm)	0.3 ± 0.2	0.9 ± 0.4
Profile (depth = 5 cm)	0.2 ± 0.3	0.6 ± 0.2
Depth-dose	0.2 ± 0.1	0.5 ± 0.2
45-degree wedge	0.6 ± 0.3	1.3 ± 0.6