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. 2013 Jul 24;135(33):12353–12359. doi: 10.1021/ja405705x

Figure 1.

Figure 1

(a) Schematic of the GLAD technique and (b) SEM images of a wafer containing helices representative of those used in this work, as well as (c) left- and (d) right-handed chiral magnetic particles and (e) the energy-selective backscattered image (lower right) highlights the magnetic Ni inclusion. Scale bar in (b) is 2 μm; (c) and (d) are 0.5 μm; and (e) is 1 μm.