Skip to main content
. 2013 Sep 5;31(6):06F103. doi: 10.1116/1.4819833

Figure 4.

Figure 4

ToF-SIMS PCA loadings plots with inset scores plots for negative (a) and positive (b) secondary ion spectra. (♦) and (▲) designate NaSS on Ti and Si, respectively; (▪) and (●) designate ClSi and Ti and Si, respectively. Open symbols designate measurements on replicate samples. (*) designate the 95% confidence intervals.