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. 2013 Nov 29;4:815–833. doi: 10.3762/bjnano.4.93

Figure 2.

Figure 2

(a) Schematic of instrumented nanoindenter, including P - calibrated force; L - support springs; D - Position sensor; I - indenter tip supported by shaft; S - sample. (b) Schematic of AFM showing Pz - piezoelectric motion transducer; S -sample; C - integrated cantilever and tip; D - cantilever motion detector; F - feedback; M - monitor for display. To right the working of AFM is shown schematically: extension of spring changes before and after applying load. From [42].