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. 2013 Aug 27;31(5):050820. doi: 10.1116/1.4818423

Figure 21.

Figure 21

(a) XPS spectrum of HOPG placed in vacuum for 90 min. (b) XPS spectrum of HOPG RF plasma cleaned in Ar for 10 min. XPS data demonstrates that Mo was introduced into the soft landing process during the sputter cleaning of the HOPG substrate.