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. 2013 Nov 8;13(11):15324–15347. doi: 10.3390/s131115324

Figure 21.

Figure 21.

X-ray diffraction patterns of In2O3 and InON films after annealing in air at 1,250 °C for ten hours. Peaks corresponding to In2O3 and InN were present in the InON film indicating that metastable nitrogen was retained in the film as part of an indium nitride phase.