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. Author manuscript; available in PMC: 2014 Jun 12.
Published in final edited form as: J Am Chem Soc. 2013 Jun 3;135(23):10.1021/ja3104632. doi: 10.1021/ja3104632

Figure 6.

Figure 6

A. Comparison of in-situ EXAFS collected on as-prepared MnOx/Au-Si3N4 film and on MnOx/Au-Si3N4 film after in-situ exposure to ORR andOER potentials. B MnOx/Au-Si3N4 film poised at 0.7 V overlayed with Mn3O4 and alpha-Mn2O3. C. MnOx/Au-Si3N4 film poised at 1.8 V overlayed with Mn3O4, alpha-Mn2O3, and birnessite.