Table 1.

Group means (number of participants), standard deviations and test statistics from rank-sum testing in measures with low and high sequential processing loads.

Sequencing load	Variable (acronym)	Variable (full name)	Mean MA	SD	Mean MU	SD	Z score	p value
Low	Rep. Keyboard Tap.	Repetitive Keyboard Tapping	0.49 (3)	0.81	0.26 (18)	0.59	−0.20	0.8407
	WID	Word Identification	−1.04 (3)	0.27	0.18 (17)	0.51	2.60	*0.0094
	NIX	Nonverbal Intelligence Index	0.13 (3)	0.8	0.82 (15)	0.72	1.48	0.1386
	AVG	Average	−0.14	0.63	0.42	0.60	1.29	0.3296
	SD	Standard Deviation	0.80	0.31	0.35	0.11	1.41	0.4473
High	NWR	Nonword Repetition	−1.22 (3)	0.38	−0.26 (18)	0.63	2.34	*0.0194
	NRT	Nonword Repetition Task	−3.01 (3)	3.85	0.63 (18)	1.72	1.81	0.0696
	SRT	Syllable Repetition Test	−2.15 (2)	0.73	−0.40 (17)	2.53	1.90	0.0576
	WATT	Word Attack	−0.47 (3)	0.46	0.44 (17)	0.77	1.96	*0.0497
	SWE	Sight Word Efficiency	−0.60 (3)	0.92	0.00 (16)	0.83	1.36	0.1751
	PDE	Phonemic Decoding Efficiency	−1.49 (3)	0.56	0.05 (16)	1.06	2.08	*0.0380
	WIAT Sp.	Wechsler Individual Achievement Test – Spelling	−1.27 (3)	1.31	0.93 (17)	0.97	2.34	*0.0192
	VIX	Verbal Intelligence Index	−0.33	0.20	1.14	0.56	2.55	*0.0108
	AVG	Average	−1.32	1.05	0.32	1.13	2.04	0.0549
	SD	Standard Deviation	0.91	1.18	0.56	0.67	0.38	0.0527

Note. All units in z scores. RS = rank-sum;

^*nominal statistical significance; negative z values indicate lower scores in the MA group, compared with the MU group.