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. 2013 Aug 23;69(Pt 9):i60. doi: 10.1107/S1600536813023106
Refinement on F2 0 restraints
Least-squares matrix: full Primary atom site location: structure-invariant direct methods
R[F2 > 2σ(F2)] = 0.020 Secondary atom site location: difference Fourier map
wR(F2) = 0.055 w = 1/[σ2(Fo2) + (0.0353P)2] where P = (Fo2 + 2Fc2)/3
S = 1.09 (Δ/σ)max < 0.001
811 reflections Δρmax = 1.86 e Å3
53 parameters Δρmin = −0.78 e Å3