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. 2014 Jan 13;4:3667. doi: 10.1038/srep03667

Figure 2. SEM and TEM images of SiNWs prepared by graphite substrate-enhanced MCEE of silicon in aerated aqueous HF solution.

Figure 2

(a), Cross-sectional SEM image of SiNW array prepared on 1–10 Ω · cm p-Si(100) wafer. (b), Cross-sectional SEM image of SiNW array prepared on 2–3 Ω · cm n-Si(100) wafer. (c), High-resolution TEM image of a Si nanowire from 1–10 Ω · cm p-Si(100) wafer. (d), High-resolution TEM image of a Si nanowire from 2–3 Ω · cm n-Si(100) wafer.