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. 2014 Jan 20;4:3765. doi: 10.1038/srep03765

Figure 3. Photo-bias stability of the ZTO control device and ZTO/IZO device.

Figure 3

(a) Time evolutions of the transfer characteristics for the ZTO control device, ZTO/IZO (5 nm) device, and ZTO/IZO (6.3 nm) device under NBIS conditions. (b) Variation of Vth shift under NBIS conditions for various devices. (c) Calculated DOS distribution as a function of the energy (E – EC) for the devices examined.